Advances in X-Ray Analysis: Volume 35B by C.S. Barrett (English) Paperback Book
77,91 €
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography.
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