Erweiterte Defekte in Halbleitern: Elektronische Eigenschaften, Geräteeffekte und St
155,82 €
This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed.
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