Feldemissions-Rasterelektronenmikroskopie: Neue Perspektiven für Materialien Char
157,08 €
He graduated at the Université Paris-Sud, Orsay, France in Material Engineering in 1997. Involved in the field of electron microscopies since 2007, he is research interested in developing and improving new scanning electron microscopy techniques to push the limits of imaging and analysis in the field of materials science and nanomaterials.
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