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JEOL BP101541-01 STAGE ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare

700,81 €

Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details.

Jetzt bei Ebay:

Zum Angebot *
  • MPN:
    BP101541-01
  • Brand:
    **BRAND**
  • System/Tool:
    JEOL JWS-2000 Wafer Defect Review SEM
  • Model:
    STAGE ITF PB
  • Category:
    Semiconductor Tools Systems and Components
  • Inventory #:
    CONF-1267
  • None:
    UPS Worldwide Saver 482,58 EUR - Lieferung zwischen 26. March 2025 und 16. April 2025 (bei heutigem Zahlungseingang)
  • Versand nach:
    Weltweit
  • Versand ausgeschlossen:
    Belarus , Côte d'Ivoire (Elfenbeinküste) , Russische Föderation , Venezuela , Postfach , Französisch-Polynesien , Libyen , Neukaledonien , Guadeloupe , Réunion , ... und weitere

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