Nahfeldemission Rasterelektronenmikroskopie von Taryl L. Kirk (Englisch) Pape
101,30 €
By Taryl L. Kirk. Author Taryl L. Kirk. Near Field Emission Scanning Electron Microscopy. Series Applied Electron Microskopy - Angewandte Elektronenmikroskopie. Language English. Place of Publication Berlin.
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